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In this paper we present results of the analysis of the thermoreflectance (TR) measurements performed on the high power laser diodes and laser bar emitting at 808 nm. Thermoreflectance is a modulation technique relying on periodic facet temperature modulation induced by pulsed current supply of the laser. The periodic temperature change of the laser induces variation of the refractive index and consequently...
Thermal properties, degradation behaviour and optical and current contributions to facet heating of high power diode lasers emitting at 808 nm are analysed. The investigated devices with non-injected facets are designed to reduce carrier recombination at the facet surface. Spatially resolved thermoreflectance spectroscopy is used to measure temperature distribution maps over the laser facet. This...
In this paper we describe a number of optical techniques suitable for estimation of the semiconductor surface temperature. High spatially resolved thermoreflectance will be shown as a powerful tool to measure temperature distribution at the laser diode front facet. For determination of the absolute value of the front facet temperature we use micro-Raman spectroscopy. Both techniques will be presented...
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