Search results for: B. Chen
2016 IEEE International Electron Devices Meeting (IEDM) > 31.3.1 - 31.3.4
2012 IEEE International Reliability Physics Symposium (IRPS) > MY.4.1 - MY.4.4
IEEE/ASME Transactions on Mechatronics > 2011 > 16 > 2 > 394 - 399