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The noise mechanisms in graphene and MoS2 are quite different. The noise characteristics of MoS2 transistors could be described by the McWhorter model. The range of the trap densities responsible for the 1/f noise in MoS2 extracted from the noise measurements is from ∼1018 eV−1cm−3 to ∼ 6×1020 eV−1cm−3. The smallest noise level and smallest trap density was found for multilayer MoS2 transistors with...
High performance and electrochemically stable Pt/graphene catalysts assisted with polydiallyldimethylammonium (PDDA) have been synthesized for PEM fuel cells. The preparation procedure and properties of the catalysts are investigated in detail. With the introduction of PDDA molecules, Pt nanoparticles can be well-dispersed on graphene support, resulting in improved electrochemical surface area and...
The studies of the low frequency noise in graphene transistors with the number of carbon layers from N=1 (single layer graphene) to N=15 showed that 1/f noise becomes dominated by the volume noise when the thickness exceeds approximately 7 atomic layers. We compare these results with the data on surface and volume noise in carbon nanotubes and Si MOS.
Graphene might become an ultimate medium for sensing applications, enabling gas and vapor detection with high sensitivity. However, changes in graphene resistivity under the gas exposure might be quite similar for different gases, making the sensing selectivity to be one of the key barriers to overcome. In this paper, we report on using low frequency noise to define the new characteristic parameters,...
The low frequency noise has been studied in mechanically exfoliated single- and bilayer graphene deposited on Si/SiO2 substrates. Measurements were performed in 2- and 4-probe configuration schemes. The analysis of the gate voltage dependences of noise showed that noise in graphene transistors does not comply with the McWhorter model. Aging of graphene transistors due to exposure to ambient resulted...
Low frequency noise in virgin (not aged) graphene transistors might be relatively low (comparable to average Si MOSFETs), at least for high quality devices with the bottom gate configuration. Graphene channels are the dominant sources of noise, even though the contact resistances have an important effect on the noise magnitude due to the voltage re-distribution between the contacts and the channel...
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