Search results for: Yi Huang
2015 IEEE International Reliability Physics Symposium > EL.5.1 - EL.5.5
IEEE Journal of Solid-State Circuits > 2014 > 49 > 3 > 708 - 717
Chemistry – A European Journal > 19 > 11 > 3721 - 3728
IEEE Electron Device Letters > 2008 > 29 > 7 > 771 - 774
IEEE Electron Device Letters > 2007 > 28 > 11 > 1033 - 1035