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Electrothermal study of the n-type SOI Fin-FETs at 50-nm node is performed by analytical method and numerical algorithm. The self-heating effects (SHE) are investigated and validated by commercial software and other published analytical solutions. Further, the time-dependent thermal conduction equation is solved to get the temperature response under different signal stresses, including step pulse,...
Electrothermal characterization of the advanced SOI FinFETs is performed in this paper, which is based on some analytical equations as well as in-house developed finite difference algorithm. The temperature-dependent properties of thermal conductivities of all materials involved are considered in our simulation, with results validated by the commercial software ANSYS and other analytical solution...
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