Search results for: Wen Wu
IEEE Design & Test > 2016 > 33 > 2 > 30 - 39
IEEE Transactions on Computers > 2016 > 65 > 3 > 770 - 780
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 7 > 1260 - 1270
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 12 > 2184 - 2194
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2011 > 30 > 6 > 919 - 929
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 12 > 1762 - 1766
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 3 > 277 - 288
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2007 > 26 > 6 > 1101 - 1113
Journal of Electronic Testing > 2003 > 19 > 2 > 207-215
Journal of Electronic Testing > 2002 > 18 > 4-5 > 515-527
Journal of Electronic Testing > 2002 > 18 > 6 > 637-647