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As a process technology is scaling, a reliability problem that may cause a failure in the functionality of the digital circuit becomes an important issue in System-on-Chip (SoC) design. This importance leads to the studies on fault diagnosis and tolerance. In this paper, we propose a static and analytical technique for fault diagnosis focused on the digital circuit. Gate level fault analysis is completed...
One of the most effective techniques to reduce a processor's power consumption is to reduce supply voltage. However, reducing voltage in the context of parameter variations can cause circuits to fail. As a result, voltage scaling is limited by a minimum voltage, often called Vccmin, beyond which circuits may not operate reliably. In this paper, we propose an architectural technique that enables microprocessor...
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