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Temperature of a block (a region in the chip) depends on both heat generation (caused by power consumption) and heat dissipation among neighbors. Power aware test solutions targeting low power consumption during testing, may not produce an acceptable thermal aware solution. In this paper, a particle swarm optimization (PSO) based test pattern generation strategy has been proposed for BIST environment...
This brief proposes a framework to analyze multiple faults based on multiple fault simulation in a particle swarm optimization environment. Experimentation shows that up to ten faults can be diagnosed in a reasonable time. However, the scheme does not put any restriction on the number of simultaneous faults.
With rapid progress in VLSI technology, temperature during testing has become a big issue. As increase in temperature during testing causes permanent or temporal damage of the chip, reduction in peak temperature of the chip becomes necessary. Temperature depends on both heat generation caused by power consumption and heat dissipation among neighboring blocks in the circuit under test (CUT). Heat generation...
This paper proposes a new application mapping technique for mesh based Network-on-Chip (NoC) using Particle Swarm Optimization (PSO). The results have been compared with techniques reported in the literature for a number of benchmark applications.
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