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With the increasing complexity of VLSI circuits and systems, their testing is becoming increasingly complex and time consuming. Apart from affecting the design turn-around time, it poses severe challenges to the test engineers in terms of meeting the power-budget and temperature limit of the chip. Power consumption during test is often much higher than in normal mode of operation. Increasing temperature...
Encoding of test stimuli and test response compaction are two widely used techniques to reduce test data volume. Limited observability due to response compaction negatively affects the diagnosis procedure which is extremely important to ramp up the production yield. When multiple chains, mapped to the same compactor output fail, AND-gate masking logic (generally use to block don't cares) at the compactor...
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