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We report the measurements of one-photon and two-photon interference of light scattered by two quantum dots, separated by 40 μm. We show how fringe contrasts are strongly affected by spectral diffusion.
We spectrally resolve the light scattered by a single InAs semiconductor quantum dot and analyze the relative contribution of elastic and inelastic scattering processes.
We investigated and compared the growth morphology of Ag films deposited on different Si surfaces at low temperatures and annealed at room temperature with scanning tunneling microscopy. Ag films on clean Si(111) 7x7 and Si(001) 2x1 surfaces exhibit with increasing film thickness: clusters (interconnected), islands with flat top terraces, flat films with voids extending down to the wetting layer,...
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