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In this work, we discussed the fault isolation method for Thin-Film Transistor (TFT). Many defects in TFT can be directly observed by optical microscope; however, for some defects, they are not visible in either optical microscope or SEM, which makes the fault isolation very challenging. We demonstrated that OBIRCH can be used to find the defect location in the leakage/short type TFT failure. The...
CMOS (Complementary Metal—Oxide—Semiconductor) image sensors are commonly used in many modern electrical products such as digital cameras, camera phones, automotive applications, gaming applications, etc. In this paper, we will discuss unusual pinkish rings which are observed in a captured colored image. The image was captured using a CMOS VGA (640H × 480V) SOC (System-On-a-Chip) digital image sensor...
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