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Thermal cyclic test is very important for astronautic electronic products to stimulate potentially critical failures and eliminate latent defects. The design of the thermal cyclic test should take the safety of test into account to avoid over-test risks. Over-test risks can cause serious consequences, such as unnecessary life cycle consumption and products failure. A method presented in this paper...
For long lifetime and high reliability products, it is difficult to obtain failure time data in a short time period. Hence, Accelerated Degradation Testing (ADT) is presented to deal with the cases that no failure time data could be obtained but degradation data of the primary parameter of the product are available. At present, there are mainly two ways to predict product life and reliability by ADT:...
The multi-source reliability information fusion method based on D-S evidential theory is presented in this paper to solve the complex system reliability assessment problems. Aimed to the multi-source reliability information, the method in this paper established basic probability assignment firstly. Then, the reliability information is fused using D-S evidential theory. After that, the fused basic...
For long lifetime and high reliability products, it is difficult to obtain failure time data in a short time period. Hence, Accelerated Degradation Testing (ADT) is presented to deal with the cases that few or no failure time data could be obtained but degradation data of the primary parameter of the product are available. Step-Stress ADT (SSADT) is commonly used for the advantage that it needs only...
The paper constructs the multi-regress-analysis reliability assessment method based on the exponential regression model due to the possible fewer samples for testing in electronic products reliability assessment. By introducing environmental severe degree factors, environmental integrated factors and technique states of the product factors, the multi-regress-analysis reliability assessment method...
Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super Luminescent Diode (SLD). Previous works on CSADT use deterministic function to describe the product degradation and they are not considered adequately. This paper proposes a CSADT data analysis method based on time series method. It proposes a...
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