Search results for: Guicui Fu
Microelectronics Reliability > 2017 > 79 > C > 221-230
Journal of Electronic Materials > 2018 > 47 > 1 > 811-819
IEEE Transactions on Power Electronics > 2017 > 32 > 4 > 3075 - 3087
Solid-State Electronics > 2017 > 129 > C > 35-43
Solid-State Electronics > 2017 > 129 > C > 81-87
IET Power Electronics > 2016 > 9 > 12 > 2416 - 2424
Engineering Failure Analysis > 2016 > 66 > C > 421-431
Solid-State Electronics > 2016 > 121 > C > 1-11
IET Power Electronics > 2016 > 9 > 5 > 1019 - 1028
Engineering Failure Analysis > 2016 > 59 > Complete > 304-313
Engineering Failure Analysis > 2015 > 47 > Part A > 229-237