Search results for: D. Yu. Kazantsev
Semiconductors > 2019 > 53 > 11 > 1472-1478
Technical Physics Letters > 2019 > 45 > 10 > 1031-1034
Technical Physics Letters > 2019 > 45 > 8 > 780-782
Technical Physics Letters > 2019 > 45 > 8 > 761-764
Technical Physics Letters > 2018 > 44 > 12 > 1127-1129
Technical Physics Letters > 2018 > 44 > 7 > 574-576
Semiconductors > 2018 > 52 > 1 > 44-52
Semiconductors > 2018 > 52 > 2 > 221-225
Technical Physics Letters > 2017 > 43 > 10 > 905-908
Semiconductors > 2017 > 51 > 5 > 667-671
Semiconductors > 2016 > 50 > 7 > 963-969
Technical Physics Letters > 2016 > 42 > 5 > 539-542
Technical Physics Letters > 2016 > 42 > 6 > 635-638
Technical Physics Letters > 2015 > 41 > 12 > 1143-1145
Semiconductors > 2014 > 48 > 1 > 30-33
Semiconductors > 2014 > 48 > 9 > 1134-1138
Surface and Interface Analysis > 45 > 1 > 364 - 365
Surface and Interface Analysis > 45 > 1 > 366 - 368
Journal of Analytical Chemistry > 2004 > 59 > 3 > 250-254