Search results for: V. S. Chernysh
Semiconductors > 2019 > 53 > 8 > 1011-1017
Journal of Visualization > 2019 > 22 > 4 > 741-750
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2019 > 13 > 2 > 344-350
Technical Physics > 2018 > 63 > 12 > 1861-1867
Moscow University Physics Bulletin > 2019 > 74 > 1 > 33-37
Moscow University Physics Bulletin > 2017 > 72 > 5 > 470-473
Semiconductors > 2017 > 51 > 6 > 745-750
Technical Physics Letters > 2017 > 43 > 1 > 95-97
Moscow University Physics Bulletin > 2016 > 71 > 1 > 87-90
Technical Physics Letters > 2015 > 41 > 11 > 1072-1074
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2014 > 8 > 2 > 251-253
Semiconductors > 2014 > 48 > 4 > 517-520
Bulletin of the Russian Academy of Sciences: Physics > 2010 > 74 > 11 > 1633-1636
Journal of Applied Spectroscopy > 2006 > 73 > 6 > 928-931