Search results for: X. Zhou
2016 IEEE International Electron Devices Meeting (IEDM) > 15.6.1 - 15.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 31.1.1 - 31.1.4
2013 IEEE International Reliability Physics Symposium (IRPS) > PI.3.1 - PI.3.5
2011 International Reliability Physics Symposium > XT.2.1 - XT.2.2
IEEE Electron Device Letters > 2011 > 32 > 6 > 770 - 772