Search results for: J. Iannacci
Microsystem Technologies > 2019 > 25 > 12 > 4709-4719
Microsystem Technologies > 2019 > 25 > 1 > 329-338
Microsystem Technologies > 2018 > 24 > 12 > 5027-5036
Microsystem Technologies > 2018 > 24 > 8 > 3227-3231
Microsystem Technologies > 2018 > 24 > 1 > 575-585
IEEE Electron Device Letters > 2016 > 37 > 12 > 1646 - 1649
IEEE Electron Device Letters > 2016 > 37 > 10 > 1336 - 1339
Microsystem Technologies > 2016 > 22 > 7 > 1811-1820
Microsystem Technologies > 2016 > 22 > 7 > 1639-1651
Microsystem Technologies > 2016 > 22 > 7 > 1865-1881
Microsystem Technologies > 2015 > 21 > 10 > 2039-2052
Microsystem Technologies > 2014 > 20 > 4-5 > 627-640
Electronics Letters > 2013 > 49 > 11
Microelectronics Reliability > 2012 > 52 > 9-10 > 2235-2239
Microsystem Technologies > 2012 > 18 > 7-8 > 965-971
Microelectronics Reliability > 2011 > 51 > 9-11 > 1869-1873