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Target poisoning is one of the major drawbacks of reactive sputtering (RS) affecting the stoichiometry of a compound film depositing onto a substrate. The dynamics of RS has been understood in terms of the well-known ‘Berg’s Model’ (Berg et al. in Thin Solid Films 565:186, 2014; Berg and Nyberg in Thin Solid Films 476(2):215, 2005) which demonstrates that by reducing the size of a sputter target,...
In this work, we studied a correlation between spin-dependent scattering and interface roughness in Cu/Co multilayers. In Cu/Co multilayers, Cu-on-Co and Co-on-Cu interfaces are not identical because of significant difference in the surface free energy of Cu and Co. By adding Ag surfactant during the growth of multilayer structure, we found that the difference between the interface roughness of two...