Search results for: T. Grasser
Journal of Computational Electronics > 2014 > 13 > 3 > 733-738
2013 IEEE International Electron Devices Meeting > 15.5.1 - 15.5.4
2013 IEEE International Electron Devices Meeting > 15.2.1 - 15.2.4
Microelectronic Engineering > 2013 > 109 > Complete > 123-125
Microelectronic Engineering > 2013 > 109 > Complete > 250-256
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.2.1 - 2D.2.7
2013 IEEE International Reliability Physics Symposium (IRPS) > 3A.4.1 - 3A.4.7
2013 IEEE International Reliability Physics Symposium (IRPS) > XT.10.1 - XT.10.6
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.3.1 - 2D.3.6
2012 International Electron Devices Meeting > 30.5.1 - 30.5.4