Search results for: T. Grasser
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 3 - 8
IEEE Electron Device Letters > 2010 > 31 > 5 > 411 - 413
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 106 - 114
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 79 - 97