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Focused-electron-beam-induced processing (FEBIP), a resist-free additive nanomanufacturing technique, is an actively researched method for “direct-write” processing of a wide range of structural and functional nanomaterials, with high degree of spatial and time-domain control. This article attempts to critically assess the FEBIP capabilities and unique value proposition in the context of processing...
The insulating phase transition in a VO2 nanobeam when subjected to external‐strain is utilized to fabricate a quick response time, highly reproducible, and high gauge factor strain sensor. Raman spectroscopy combined with electromechanical measurement reveals the working principle.
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