Search results for: T. Kim
IEEE Journal of Solid-State Circuits > 2016 > 51 > 1 > 18 - 30
IEEE Journal of Solid-State Circuits > 2015 > 50 > 8 > 1809 - 1819
IEEE Journal of Solid-State Circuits > 2014 > 49 > 4 > 917 - 927
2012 IEEE International Reliability Physics Symposium (IRPS) > ME.3.1 - ME.3.6
IEEE Electron Device Letters > 2012 > 33 > 8 > 1207 - 1209
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1137 - 1143