Search results for: Tadashi Takemoto
Microelectronics Reliability > 2013 > 53 > 12 > 2005-2011
Journal of Electronic Materials > 2013 > 42 > 6 > 1260-1267
Journal of Materials Processing Tech. > 2011 > 211 > 9 > 1534-1539
Journal of Materials Science: Materials in Electronics > 2011 > 22 > 7 > 735-740
Journal of Materials Science: Materials in Electronics > 2011 > 22 > 5 > 538-544
Microelectronics Reliability > 2010 > 50 > 2 > 220-227
Metallurgical and Materials Transactions B > 2010 > 41 > 4 > 864-871
Journal of Electronic Materials > 2010 > 39 > 4 > 426-432
Journal of Electronic Materials > 2010 > 39 > 1 > 115-123
Journal of Electronic Materials > 2010 > 39 > 10 > 2274-2280
Journal of Electronic Materials > 2010 > 39 > 8 > 1241-1247
Journal of Materials Processing Tech. > 2009 > 209 > 11 > 5054-5059
Journal of Alloys and Compounds > 2009 > 472 > 1-2 > 530-534
Microelectronics Reliability > 2009 > 49 > 3 > 296-302
Metallurgical and Materials Transactions B > 2009 > 40 > 1 > 39-44
Journal of Electronic Materials > 2009 > 38 > 12 > 2610-2616
Materials Letters > 2008 > 62 > 15 > 2257-2259
Journal of Materials Science > 2008 > 43 > 10 > 3643-3648
Materials Science & Engineering B > 2008 > 148 > 1-3 > 124-127
Journal of Electronic Materials > 2008 > 37 > 1 > 45-50