Search results for: Yuejin Hou
Springer Series in Reliability Engineering > Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections > 39-71
Springer Series in Reliability Engineering > Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections > 1-3
Springer Series in Reliability Engineering > Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections > 113-130
Springer Series in Reliability Engineering > Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections > 5-38
Springer Series in Reliability Engineering > Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections > 73-112
Springer Series in Reliability Engineering > Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections > 131-145
Springer Series in Reliability Engineering
Microelectronics Reliability > 2009 > 49 > 9-11 > 1086-1089
2008 10th Electronics Packaging Technology Conference > 1148 - 1153