Search results for: V. Morellas
Proceedings of the 2010 American Contrl Conference > 4456 - 4461
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2008 > 30 > 4 > 746 - 751
Machine Vision and Applications > 2003 > 15 > 1 > 29-45
Proceedings of the 2010 American Contrl Conference > 4456 - 4461
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2008 > 30 > 4 > 746 - 751
Machine Vision and Applications > 2003 > 15 > 1 > 29-45