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The frequency dependence of oxide trap coupling effect in nanoscale MOSFETs under AC switching condition is discussed thoroughly, with experimental and theoretical studies. By using AC STR measurement, a decreased tendency of trap coupling strength with increased frequency is observed. Rather than conventional 2-state trap model, it is found that only the explanation based on complete 4-state trap...
The frequency dependence of the single-trap induced degradation (STID) are investigated both experimentally and theoretically, which is the key for the understanding of AC NBTI characteristics and temporal variations. Instead of the conventional 2-state trap model (2SM), the 4-state trap model (4SM) are studied through Monte-Carlo simulation in detail, which give a reasonable interpretation of the...
In this paper, the frequency dependence of the dynamic variation induced by AC NBTI aging in scaled high-κ/metal-gate devices are experimentally studied for the first time. Challenges in comprehensively characterizing AC NBTI induced variation are addressed by the modified method. The additional variation source in AC NBTI, originating from the variations among each AC clock cycle, is found to be...
Since devices actually operate under AC signals in digital circuits, it is more informative to study random telegraph noise (RTN) at dynamic AC biases than at constant DC voltages. We found that the AC RTN statistics largely deviates from traditional DC RTN, in terms of different distribution functions and the strong dependence on AC signal frequency, which directly impacts on the accurate prediction...
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