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Electrical testing method is the most efficient and cost-effective method to determine whether semiconductor chips are defective. In the wafer state, an interface device called a probe card is needed to physically contact with the pad for electrical test. Recently, the environment for wafer test is getting more challenging. This is because of decrease in pad-size due to device shrinkage, and increase...
Electrical testing method is the most efficient and cost-effective method to determine whether semiconductor chips are defective. In the wafer state, an interface device called a probe card is needed to physically contact with the pad for electrical test. Recently, the environment for wafer test is getting more challenging. This is because of decrease in pad-size due to device shrinkage, and increase...
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