Search results for: Fei Lu
IEEE Transactions on Power Electronics > 2018 > 33 > 2 > 1633 - 1643
IEEE Electron Device Letters > 2017 > 38 > 5 > 630 - 632
2016 IEEE International Reliability Physics Symposium (IRPS) > 3B-6-1 - 3B-6-5
IEEE Electron Device Letters > 2014 > 35 > 3 > 381 - 383