Search results for: Linda Milor
2012 IEEE International Reliability Physics Symposium (IRPS) > BD.4.1 - BD.4.8
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 5 > 855 - 864
Microelectronics Reliability > 2011 > 51 > 9-11 > 1582-1586
2011 International Reliability Physics Symposium > 2C.2.1 - 2C.2.10
IEEE Transactions on Semiconductor Manufacturing > 2011 > 24 > 3 > 385 - 391
Microelectronics Journal > 2010 > 41 > 11 > 789-800
Microelectronics Reliability > 2010 > 50 > 9-11 > 1341-1346
IEEE Transactions on Semiconductor Manufacturing > 2010 > 23 > 3 > 429 - 441
Microelectronics Reliability > 2009 > 49 > 9-11 > 1096-1102
Integration, the VLSI Journal > 2009 > 42 > 3 > 312-320
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 12 > 1687 - 1695
Microelectronics Reliability > 2007 > 47 > 9-11 > 1473-1477
Microelectronics Reliability > 2007 > 47 > 9-11 > 1478-1482
Microelectronics Reliability > 2005 > 45 > 9-11 > 1305-1310