Search results for: Mihai Tazlauanu
2017 IEEE MTT-S International Microwave Symposium (IMS) > 1753 - 1755
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 371 - 380
IEEE Journal of Solid-State Circuits > 2015 > 50 > 10 > 2239 - 2255