Search results for: Mottaqiallah Taouil
Microelectronics Reliability > 2018 > 87 > C > 158-167
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3464 - 3472
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2206 - 2219
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1444 - 1454
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 11 > 1860 - 1872