The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Current projections estimate there will be 25–30 billion devices on the Internet of Things (IoT) by 2020. While technology scaling no longer brings automatic system energy savings, emerging big-data and wearable-monitoring applications require compact autonomous devices. These divergent requirements steer research towards new energy efficiency strategies for compact wireless devices at the circuit...
With changing retirement ages and an aging workforce, interest is growing on the potential contribution of relevant bundles of HR practices in eliciting well‐being and performance among aging workers. Drawing on theories on lifespan development and self‐regulation, we distinguished two bundles of HR practices: development HR practices that help individual workers reach higher levels of functioning...
In scaled VLSIs, a reliable robust circuit system is essential for the sustainable secure society. The threat to the VLSI system is caused by device, circuit or system issues. This forum provides an overview of the technical challenges as well as recent advances in circuit and system-level reliable VLSI technologies. The forum starts with the overview on the robustness and fault tolerance requirements...
A 33-ns 64-Mb DRAM with a master-wordline architecture that allows for wordline boosting has been successfully designed and fabricated. The master-wordline scheme incorporates a high-threshold PFET which enables the boost voltage to be controlled by standard CMOS levels. The high-threshold PFET also generates a stable low-power reference voltage for the boost system.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.