Search results for: Jacopo Franco
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4011 - 4017
2017 IEEE International Reliability Physics Symposium (IRPS) > FA-5.1 - FA-5.4
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-8.1 - XT-8.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 5C-4.1 - 5C-4.7
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1467 - 1473
IEEE Electron Device Letters > 2017 > 38 > 3 > 318 - 321
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 253 - 258
IEEE Electron Device Letters > 2017 > 38 > 2 > 160 - 163
IEEE Electron Device Letters > 2016 > 37 > 8 > 1055 - 1058
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1853 - 1860
2016 IEEE International Reliability Physics Symposium (IRPS) > 6B-2-1 - 6B-2-6
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-2-1 - 4A-2-6
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-10-1 - XT-10-6
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-4-1 - 4B-4-6
IEEE Electron Device Letters > 2016 > 37 > 1 > 84 - 87
2015 IEEE International Electron Devices Meeting (IEDM) > 31.7.1 - 31.7.4
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3633 - 3639
Microprocessors and Microsystems > 2015 > 39 > 8 > 1039-1051