Search results for: D. Donoval
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.6.1 - XT.6.7
Microelectronics Reliability > 2012 > 52 > 3 > 463-468
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2979 - 2986
Physics Procedia > 2012 > 32 > Complete > 285-288
Journal of Electronic Materials > 2012 > 41 > 11 > 3017-3020
2011 International Reliability Physics Symposium > 2E.2.1 - 2E.2.8
Microelectronic Engineering > 2011 > 88 > 2 > 166-169
Surface and Interface Analysis > 43 > 1‐2 > 518 - 521
Chemical Physics Letters > 2010 > 484 > 4-6 > 299-303