Search results for: Run Hu
Microelectronics Reliability > 2017 > 71 > Complete > 51-55
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 463 - 466
Progress in Energy and Combustion Science > 2016 > 56 > C > 1-32
IEEE Photonics Technology Letters > 2015 > 27 > 12 > 1337 - 1340
International Journal of Heat and Mass Transfer > 2014 > 77 > C > 891-896
Optik - International Journal for Light and Electron Optics > 2013 > 124 > 19 > 3895-3897
IEEE Photonics Technology Letters > 2013 > 25 > 3 > 246 - 249