Search results for: T. Nishimura
2013 IEEE International Electron Devices Meeting > 2.5.1 - 2.5.4
2013 IEEE International Electron Devices Meeting > 2.3.1 - 2.3.4
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1295 - 1301
2010 International Electron Devices Meeting > 18.1.1 - 18.1.4