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The ability to record large field-of-view images without a loss in spatial resolution is of crucial importance for imaging science. For most imaging techniques however, an increase in field-of-view comes at the cost of decreased resolution. Here we present a novel extension to ptychographic coherent diffractive imaging that permits simultaneous full-field imaging of multiple locations by illuminating...
We use reflection-mode ptychography CDI with HHG illumination to image copper nanostructures buried beneath 100nm of aluminum. Our technique yields absolute reflectivity images, allowing non-destructive detection of diffusion at the Al-Cu boundary, confirmed by Auger-Electron-Spectroscopy.
We extend ptychography CDI to allow for imaging of multiple areas on a sample simultaneously using multiple identical beams. This enables high throughput imaging of large samples without increased data collection or loss in resolution.
We demonstrate a record near-wavelength limited 17.5nm spatial resolution for EUV imaging using ptychographic coherent diffractive imaging with illumination at 13.5nm from a high-harmonic light source.
Scanning electron microscopy and atomic force microscopy are well-established techniques for imaging surfaces with nanometer resolution. Here we demonstrate a complementary and powerful approach based on tabletop extreme-ultraviolet ptychography that enables quantitative full field imaging with higher contrast than other techniques, and with compositional and topographical information. Using a high...
We demonstrate the most general, highest fidelity, reflection mode coherent diffractive imaging to date. By combining tabletop high harmonics with ptychography and keyhole coherent diffraction techniques, images are reconstructed with < 3 nm axial resolution.
We use keyhole coherent diffraction imaging to gain ∼20x increase in flux and fully characterize the illumination, allowing us to image a semi-transparent sample in amplitude and phase. This capability is important for x-ray microscopes.
Coherent x-ray diffractive imaging (CXDI) is a powerful technique for wavelength-limited, ultrafast images. We present a novel analysis and demonstration of Fresnel-regime (near field) CXDI with a tabletop 13 nm high harmonic generation source.
We demonstrate coherent diffraction imaging (CDI) using the projected image of an aperture as a support. This method is strikingly simple and allows CDI imaging of non-isolated objects in transmission and reflection.
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