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In a cross-sectional X-ray energy dispersive spectroscopy mapping study of sputtered CdTe cells, sulfur was found to migrate and accumulate near the back contact. X-ray emission spectra of chloride-treated CdS/CdTe films confirm the accumulation of sulfur at the back surface. A part of the surface sulfur is found to be oxidized in the form of sulfate when Cu is present at the back contact.
We have used the MR-CAT beam-line of the Advanced Photon Source (APS) at Argonne National Laboratory to study Cu x-ray fluorescence (XRF) in CdS/CdTe/Au structures on fused silica without transparent conductive oxide (TCO). After a “peel-off” process that separates the back contact at the CdTe/Cu interface both parts were studied by XRF. In order to locate the Cu spatially, we prepared TEM cross-sections...
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