Search results for: Ulrich Abelein
DAC Design Automation Conference 2012 > 205 - 213
2011 Sixteenth IEEE European Test Symposium > 111 - 116
Thin Solid Films > 2008 > 517 > 1 > 365-368
Solid State Electronics > 2007 > 51 > 10 > 1405-1411
IEEE Electron Device Letters > 2007 > 28 > 1 > 65 - 67