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In this paper, an effective baking methodology to remove thin film stability monitor wafer surface contamination is reported. We consider baking temperature, baking time, and time interval between baking and measurement as three key factors for methodology optimization study. A long-time and durative experiment is designed for the obtaining of a suitable and feasible baking condition, in which design...
The Binary Particle Swarm Optimization (BPSO) algorithm is introduced for face recognition. To do this, the original face images are first transformed into feature vectors by utilizing two-dimensional Discrete Cosine Transform (DCT). Secondly, the features are selected by means of the BPSO algorithm from the feature vectors, in order to obtain the most representative features of human faces. Compared...
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