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Unknown values (Xs) may exist in a design due to uninitialized registers or blocks that are powered down. Due to limitations known as X-optimism and X-pessimism, such Xs cannot be handled correctly in logic simulation, producing inaccurate simulation values that can mask X bugs or corrupt simulation results. This can cause X bugs to escape verification and reduces design quality. To resolve such X-related...
Unknown values (Xs) may exist in a design due to uninitialized registers or blocks that are powered down. Due to X-pessimism in gate-level logic simulation, such Xs cannot be handled correctly, producing false Xs that result in inaccurate simulation values. To improve gate-level simulation accuracy when Xs exist, we first trace the fan-in cone of Xs to check whether they are real. For the Xs that...
Due to the dramatic increase in design complexity, verifying the functional correctness of a circuit is becoming more difficult. Therefore, bugs may escape all verification efforts and be detected after tape-out. While most existing solutions focus on fixing the problem on the hardware, in this work we propose a different methodology that tries to generate constraints which can be used to mask the...
Due to increasing semiconductor design complexity, more errors are escaping presilicon verification and being discovered only after manufacturing. As an alternative to traditional manual chip repair, the authors propose the FogClear methodology, which automates the postsilicon debugging process and thereby reduces IC development time and costs.
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