Search results for: T. M. Mak
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 3 > 435 - 443
Journal of Electronic Testing > 2014 > 30 > 1 > 111-123
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 9 > 1621 - 1633
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 12 > 2322 - 2325
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2006 > 14 > 12 > 1368 - 1378