Search results for: D S Ang
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1013 - 1022
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
2011 International Reliability Physics Symposium > XT.10.1 - XT.10.5
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 19 - 34
IEEE Electron Device Letters > 2011 > 32 > 10 > 1337 - 1339