Search results for: Huixiang Huang
Journal of the Mechanical Behavior of Biomedical Materials > 2017 > 68 > C > 210-215
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-2 > 2369 - 2376
Microsystem Technologies > 2018 > 24 > 1 > 179-192
Microelectronics Reliability > 2016 > 57 > C > 1-9
Microelectronics Journal > 2014 > 45 > 6 > 759-766
Nuclear Inst. and Methods in Physics Research, A > 2014 > 748 > Complete > 70-78
Nuclear Inst. and Methods in Physics Research, A > 2014 > 745 > Complete > 128-132
Microelectronics Reliability > 2014 > 54 > 4 > 730-737
Nuclear Inst. and Methods in Physics Research, B > 2014 > 319 > Complete > 141-145
IEEE Transactions on Nuclear Science > 2014 > 61 > 3-2 > 1400 - 1406
IEEE Electron Device Letters > 2014 > 35 > 5 > 503 - 505
Microelectronics Journal > 2013 > 44 > 2 > 86-93
Microelectronics Reliability > 2013 > 53 > 2 > 259-264
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-2 > 4697 - 4704
IEEE Transactions on Nuclear Science > 2013 > 60 > 2-2 > 1354 - 1360
Procedia Engineering > 2012 > 31 > Complete > 828-833