Search results for: I De Munari
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 12 > 1719 - 1729
Microelectronics Reliability > 2007 > 47 > 9-11 > 1492-1496
Computational Materials Science > 2001 > 22 > 1-2 > 13-18
Microelectronics Reliability > 2000 > 40 > 8-10 > 1317-1322
Microelectronics Reliability > 1999 > 39 > 11 > 1647-1656