Search results for: J F Duque-Carrillo
Journal of Electronic Testing > 2006 > 22 > 4-6 > 437-448
Analog Integrated Circuits and Signal Processing > 2006 > 46 > 3 > 241-252
Analog Integrated Circuits and Signal Processing > 2003 > 34 > 3 > 221-232
Analog Integrated Circuits and Signal Processing > 2002 > 33 > 2 > 117-126