Search results for: Tian Shen
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3555 - 3562
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-2.1 - DG-2.5
IEEE Electron Device Letters > 2017 > 38 > 1 > 119 - 122
2016 IEEE International Reliability Physics Symposium (IRPS) > IT-1-1 - IT-1-4
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 755 - 759
2015 IEEE International Reliability Physics Symposium > 3A.2.1 - 3A.2.6
2015 IEEE International Reliability Physics Symposium > 2A.1.1 - 2A.1.5
2014 IEEE International Reliability Physics Symposium > 3A.5.1 - 3A.5.5
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 6 > 1454 - 1460
2011 International Conference on Computer Vision > 279 - 286