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Many contemporary electronic systems are based on System-on-Chips (SoC) such as micro-controllers or signal processors that communicate with many peripheral devices on the system board and beyond. While, SoC test was a topic of extremely high interest during the last decade, the test beyond SoCs didn't get much attention after introduction of Boundary Scan (BS) 30 years ago. It is not a surprise that...
We propose a hierarchical approach for the macro level cause-effect physical defect diagnosis in digital circuits. As macros we may consider arbitrary subcircuits or library components (e.g. complex gates) of digital circuits. The faulty macro location procedure is considered as a two step task. First, to locate a subset of suspected faulty macros in a network by using stuck-at-fault (SAF) dictionaries...
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