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The complexity of digital systems is constantly growing. This has resulted in an increasing trend in design errors and manufacturing faults in modern VLSI systems. As the result, verification and test will continue to dominate as crucial factors in time-to-market, reliability, and cost of VLSI systems.
The paper presents an approach for integration of automatic test bench generation based on a hierarchical test pattern generator Decider into the high-level synthesis flow Abelite. While the high-level synthesis flow provides fast results of complex systems design, functional verification of the design including initial specification has remained until now a sophisticated manual process. The automatically...
The paper presents an approach for assertion coverage analysis targeted at quality assessment of simulation-based verification stimuli and design error debug. The approach considers high-level decision diagrams based design verification flow and relies on temporally extended high-level decision diagrams for PSL assertion representation. The discussed case study illustrates the advantages of the proposed...
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