Search results for: Yong Kang
IEEE Electron Device Letters > 2013 > 34 > 2 > 196 - 198
IEEE Electron Device Letters > 2012 > 33 > 9 > 1234 - 1236
2011 International Reliability Physics Symposium > 5A.4.1 - 5A.4.5
IEEE Electron Device Letters > 2011 > 32 > 11 > 1474 - 1476
IEEE Electron Device Letters > 2011 > 32 > 12 > 1668 - 1670
IEEE Electron Device Letters > 2010 > 31 > 10 > 1104 - 1106